Concepedia

E. Xiao

EX

Statistics

Publications

1

Citations

45

H-Index

1

Active since

2004

Affiliations

The University of Texas at Arlington(Current)

E. Xiao is an author at The University of Texas at Arlington specializing in stress measurement, semiconductor devices, and semiconductor reliability.

Publications per year

2004–2004

1

Publications

1

CMOS RF and DC Reliability Subject to Hot Carrier Stress and Oxide Soft Breakdown

E. Xiao, J.S. Yuan, Hyeok-Jun Yang · IEEE Transactions on Device and Materials Reliability · 2004 · 45 citations · Full text

Engineering, Electrical Engineering, Circuit Theory +16

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