T. Arai - Concepedia

Author

T. Arai

Rigaku (Japan)

Also Known As

Arai, T., T Arai, T. Arai, TOMOYA ARAI, Taiga Arai, Takako Arai, Tomoya ARAI, Tomoya Arai

100

Publications

331

Citations

H-Index

Concepts

All Affiliations

Rigaku (Japan)

About

T. Arai is an author at Rigaku (Japan) specializing in engineering, spectroscopy, and x-ray spectroscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	178
2	Applied Physics	4	4	83
3	Health Sciences	3	3	39
4	Natural Sciences	2	2	58
5	Chemical Engineering	1	1	13

T. Arai

Publications

202

Citations

H-Index

Page 1

	Year	Citations
Wide Range Two-Crystal Vacuum X-ray Spectrometer for Chemical State Analysis Y. Gohshi, Hitoshi Kamada, K. Kohra, Applied Spectroscopy X-ray CrystallographyX-ray SpectroscopyEngineeringChemistryMagnesium Kα	1982	45
Electrical properties of doped conjugated polyelectrolytes with modulated density of the ionic functionalities Cheng‐Kang Mai, T. Arai, Xiaofeng Liu, Chemical Communications	2015	24
Measurements of the Special Distribution Emitted From X-Ray Spectrographic Tubes T. Arai, Takashi Shoji, Kazuhiko Omote Advances in X-ray Analysis Materials ScienceX-ray SpectroscopyEngineeringSpectroscopyMechanical Engineering	1985	21
Performance of multiwafer reactor GaN MOCVD system H. Tokunaga, Hua Tan, Yoshiaki Inaishi, Journal of Crystal Growth Electrical EngineeringGan Power DeviceEngineeringEnergy Efficiency	2000	18
Compositional-petrologic investigation of eucrites and the QUE94201 Shergottite. Harry P. Warren, W. G. Kallemeyn, T. Arai, EngineeringGeologyGeochemistryMineral GeochemistryChemistry	1996	17
Determination of Boron Oxide in Glass by X-Ray Fluorescence Analysis T. Arai, Taiji Sohmura, H. Tamenori Advances in X-ray Analysis X-ray SpectroscopyEngineeringLuminescent GlassOptical GlassChemistry	1982	14
Intensity and distribution of background x‐rays in wavelength‐dispersive spectrometry T. Arai X-Ray Spectrometry X-ray SpectroscopyHealth SciencesPhysicsEngineeringBackground X‐rays	1991	13
Improvement of Total Reflection X-ray Fluorescence (TXRF) spectrochemical analysis for silicon wafers M. Funabashi, T. Utaka, T. Arai Spectrochimica Acta Part B Atomic Spectroscopy Chemical EngineeringSilicon WafersX-ray SpectroscopyEngineeringAnalytical Instrumentation	1997	13
Charge behavior in a plasmonic photocatalyst composed of Au and TiO<sub>2</sub> Go Kawamura, T. Arai, Hiroyuki Muto, Catalysis Science & Technology Materials ScienceEngineeringPhotochemistryNanomaterialsNanotechnology	2018	13
Wavelength Dispersing Devices for Soft and Ultrasoft X-ray Spectrometers T. Arai, Takashi Shoji, Richard W. Ryon Advances in X-ray Analysis Materials ScienceLight ElementsX-ray SpectroscopyEngineeringOptical Properties	1984	12

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