Benjamin K. Tsai

Reference Data Set of Human Skin Reflectance

Catherine C. Cooksey, David W. Allen, Benjamin K. Tsai · Journal of Research of the National Institute of Standards and Technology · 2017 · 38 citations · Full text

Natural Sciences, Chemistry, Biomedical Optics +14

A comparison of optical properties between solid PTFE (Teflon) and (low density) sintered PTFE

Benjamin K. Tsai, David W. Allen, Leonard M. Hanssen et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 37 citations

Natural Sciences, Materials Engineering, Materials Science +16

Modeling of solvent evaporation effects for hot plate baking of photoresist

Chris A. Mack, David Dewitt, Benjamin K. Tsai et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1994 · 20 citations

Engineering, Materials Engineering, Materials Science +17

The extension of the NIST BRDF scale from 1100 nm to 2500 nm

Howard W. Yoon, David W. Allen, George P. Eppeldauer et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009 · 20 citations

Natural Sciences, Chemistry, Optical Materials +16

A collection and statistical analysis of skin reflectance signatures for inherent variability over the 250 nm to 2500 nm spectral range

Catherine C. Cooksey, Benjamin K. Tsai, David W. Allen · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014 · 20 citations

Natural Sciences, Biostatistics, Biomedical Optics +13