Benjamin K. Tsai - Concepedia

Author

Benjamin K. Tsai

National Institute of Standards and Technology

Also Known As

Benjamin K. Tsai, Benjamin K Tsai, Benjamin K. Tsai

Publications

434

Citations

H-Index

Concepts

All Affiliations

National Institute of Standards and Technology

About

Benjamin K. Tsai is an author at National Institute of Standards and Technology specializing in engineering, optical properties, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	161
2	Applied Physics	2	2	56
3	Education	1	1	15
4	Health Sciences	1	1	20
5	Medicine	1	1	20

Benjamin K. Tsai

Publications

200

Citations

H-Index

Page 1

	Year	Citations
A comparison of optical properties between solid PTFE (Teflon) and (low density) sintered PTFE Benjamin K. Tsai, David W. Allen, Leonard M. Hanssen, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Optical MaterialsEngineeringOptical TestingLow DensityRayleigh Scattering	2008	36
Reference Data Set of Human Skin Reflectance Catherine C. Cooksey, David W. Allen, Benjamin K. Tsai Journal of Research of the National Institute of Standards and Technology Reference Reflectance SpectraEngineeringBiometricsWearable TechnologyDermatology	2017	34
Modeling of solvent evaporation effects for hot plate baking of photoresist Chris A. Mack, David Dewitt, Benjamin K. Tsai, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Hot Plate BakingEngineeringSolvent DiffusionThermal ProcessingChemical Engineering	1994	20
The extension of the NIST BRDF scale from 1100 nm to 2500 nm Howard W. Yoon, David W. Allen, George P. Eppeldauer, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2009	20
A collection and statistical analysis of skin reflectance signatures for inherent variability over the 250 nm to 2500 nm spectral range Catherine C. Cooksey, Benjamin K. Tsai, David W. Allen Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMeasurementReflectance MeasurementsBiometricsDermatoglyphic	2014	20
Exposure study on UV-induced degradation of PTFE and ceramic optical diffusers Benjamin K. Tsai, Catherine C. Cooksey, David W. Allen, Applied Optics	2019	19
Spectral reflectance variability of skin and attributing factors Catherine C. Cooksey, Benjamin K. Tsai, David W. Allen Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMeasurementBiometricsWearable TechnologyDermatology	2015	15
Characterization of Lightpipe Radiation Thermometers for The NIST Test Bed Benjamin K. Tsai, Christopher W. Meyer, F. J. Lovas International Conference on Advanced Thermal Processing of Semiconductors EngineeringMeasurementCalibrationNist Test BedInstrument Science	2000	15
Radiative Calibration of Heat Flux Sensors at NIST: An Overview A V. Murthy, Benjamin K. Tsai, Robert D. Saunders Sensor CalibrationRadiative Heat TransferHeat Flux SensorsHigh Temperature BlackbodyEngineering	1997	11
Transfer Calibration of Heat Flux Sensors at NIST A V. Murthy, Benjamin K. Tsai Sensor CalibrationElectrical EngineeringEngineeringSensorsCalibration	1997	10

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