Peter D. Burns - Concepedia

Author

Peter D. Burns

Kodak (United States)

Also Known As

Peter Burns, Peter D. Burns

Publications

832

Citations

H-Index

Concepts

All Affiliations

Kodak (United States)Rochester Institute of Technology Carestream (United States)

About

Peter D. Burns is an author at Kodak (United States) specializing in engineering, computational imaging, and calibration.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	19	599
2	Health Sciences	9	9	333
3	Biostatistics	7	7	132
4	Education	4	4	94
5	Natural Sciences	1	1	20

Peter D. Burns

Publications

675

Citations

H-Index

Page 1

	Year	Citations
Slanted-Edge MTF for Digital Camera and Scanner Analysis Peter D. Burns EngineeringMeasurementComputer-aided DesignDigital CameraImage Analysis	2000	167
Analysis Multispectral Image Capture Peter D. Burns, Roy S. Berns Color and Imaging Conference Digital CameraMachine VisionComputer VisionImage AnalysisEngineering	1996	97
Error propagation analysis in color measurement and imaging Peter D. Burns, Roy S. Berns Color Research & Application Image AnalysisEngineeringMedical ImagingColor ReproductionCalibration	1997	55
<title>Multispectral-based color reproduction research at the Munsell Color Science Laboratory</title> Roy S. Berns, Francisco H. Imai, Peter D. Burns, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	1998	42
Refined Slanted-Edge Measurement from Practical Camera and Scanner Testing. Peter D. Burns, Don Williams EngineeringMeasurementScanner TestingEducationSpatial Frequency Response	2002	27
ANALYSIS OF IMAGE NOISE IN MULTISPECTRAL COLOR ACQUISITION Peter D. Burns RIT Scholar Works (Rochester Institute of Technology)	1997	24
Diagnostics for Digital Capture using MTF Don Williams, Peter D. Burns EngineeringMeasurementDiagnosisEducationInformation Forensics	2001	24
Quantification of Banding, Streaking and Grain in Flat Field Images. Paul J. Kane, Theodore Bouk, Peter D. Burns, EngineeringMicroscopySpectrum EstimationImage ForensicsNoise Reduction	2000	23
<title>Low-frequency MTF estimation for digital imaging devices using slanted-edge analysis</title> Don Williams, Peter D. Burns Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Image ReconstructionEngineeringMeasurementCavity EffectLow-frequency Mtf Estimation	2003	23
Using Slanted Edge Analysis for Color Registration Measurement Peter D. Burns, Don Williams PICS Geometric ModelingImage AnalysisMachine VisionEngineeringEdge Detection	1999	22

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