Don Williams

Benchmarking of the ISO 12233 Slanted-edge Spatial Frequency Response Plug-in.

Don Williams · PICS · 1998 · 38 citations

Engineering, Iso 12233, Measurement +7

Refined Slanted-Edge Measurement from Practical Camera and Scanner Testing.

Peter D. Burns, Don Williams · 2002 · 27 citations

Engineering, Measurement, Scanner Testing +20

Diagnostics for Digital Capture using MTF

Don Williams, Peter D. Burns · 2001 · 24 citations

Engineering, Measurement, Diagnosis +19

<title>Low-frequency MTF estimation for digital imaging devices using slanted-edge analysis</title>

Don Williams, Peter D. Burns · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 23 citations

Image Reconstruction, Engineering, Measurement +21

Using Slanted Edge Analysis for Color Registration Measurement

Peter D. Burns, Don Williams · PICS · 1999 · 22 citations

Geometric Modeling, Image Analysis, Machine Vision +15