A. Meisel

Auger parameters and relaxation energies of phosphorus in solid compounds

Rainer Franke, Th. Chassé, P. Streubel et al. · Journal of Electron Spectroscopy and Related Phenomena · 1991 · 173 citations

Materials Science, Engineering, Physicochemical Analysis +6

Relaxation energies in XPS and XAES of solid sulfur compounds

Heiko Peisert, T. Chassé, P. Streubel et al. · Journal of Electron Spectroscopy and Related Phenomena · 1994 · 156 citations

X-ray Spectroscopy, Engineering, Natural Sciences +7

Determination of Effective Atomic Charges from the Chemical Shifts of X-Ray Emission Lines

G. Leonhardt, A. Meisel · The Journal of Chemical Physics · 1970 · 87 citations

X-ray Spectroscopy, Engineering, Atomic Emission Spectroscopy +19

Interpretation of XPS core level shifts and structure of thin silicon oxide layers

J. Finster, Dietmar Schulze, F. Bechstedt et al. · Surface Science · 1985 · 79 citations

Materials Engineering, Engineering, Physics +9

Characterization of amorphous SiOx layers with ESCA

J. Finster, Dietmar Schulze, A. Meisel · Surface Science · 1985 · 50 citations

Materials Science, Engineering, Surface Science +5