Auger parameters and relaxation energies of phosphorus in solid compounds

Rainer Franke, Th. Chassé, P. Streubel, +1

Journal of Electron Spectroscopy and Related Phenomena

Materials ScienceEngineeringPhysicochemical AnalysisApplied PhysicsSolid-state Chemistry +4

Relaxation energies in XPS and XAES of solid sulfur compounds

Heiko Peisert, T. Chassé, P. Streubel, +2

Journal of Electron Spectroscopy and Related Phenomena

X-ray SpectroscopyEngineeringNatural SciencesApplied PhysicsSolid-state Chemistry +5

Determination of Effective Atomic Charges from the Chemical Shifts of X-Ray Emission Lines

G. Leonhardt, A. Meisel

The Journal of Chemical Physics

X-ray SpectroscopyEngineeringAtomic Emission SpectroscopyX-ray Line ShiftsChemistry +17

Interpretation of XPS core level shifts and structure of thin silicon oxide layers

J. Finster, Dietmar Schulze, F. Bechstedt, +1

Surface Science

Materials EngineeringEngineeringPhysicsNanoelectronicsOxide Electronics +7

Characterization of amorphous SiOx layers with ESCA

J. Finster, Dietmar Schulze, A. Meisel

Surface Science

Materials ScienceEngineeringSurface ScienceApplied PhysicsSemiconductor Material +3

A new method for determining relaxation energies by means of aes and xps and its application to silicon compounds

F. Bechstedt, R. Enderlein, R. Fellenberg, +2

Journal of Electron Spectroscopy and Related Phenomena

Relaxation ProcessElectrical EngineeringEngineeringPhysicsNatural Sciences +9

ON THE SHAPE AND WIDTH OF THE MAIN LINES OF X-RAY K EMISSION OF THE 3 d AND 4 d ELEMENTS

J. Finster, G. Leonhardt, A. Meisel

Le Journal de Physique Colloques

X-ray CrystallographyX-ray SpectroscopyEngineeringD ElementsLarge Broadening +16

Investigation of core-excited quantum yield spectra of high-symmetric boron compounds

K.‐H. Hallmeier, R. Szargan, A. Meisel, +2

Spectrochimica Acta Part A Molecular Spectroscopy

Excited State PropertyBoron NitrideElectronic Excited StatePhysicsNatural Sciences +5

Interaction between sulphur and oxygen on Fe(111)

W. Arabczyk, Theodore F. Baumann, H.‐J. Müssig, +2

Vacuum

Oxygen Reduction ReactionInorganic ChemistryEngineeringPhysical ChemistryRedox Chemistry +2

X-ray photoelectron spectroscopic core level shifts of phosphorus in phosphates and native oxide layers on InP(100). Applications of the Auger parameter concept

T. Chassé, Rainer Franke, C. Urban, +3

Journal of Electron Spectroscopy and Related Phenomena

Materials ScienceEngineeringNative Oxide LayersNatural SciencesSpectroscopy +5