Li-Feng Teng

Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

Po‐Tsun Liu, Yi-Teh Chou, Li-Feng Teng · Applied Physics Letters · 2009 · 223 citations

Environment-dependent Metastability, Stress Voltage, Electrical Engineering +13

Effects of microwave annealing on electrical enhancement of amorphous oxide semiconductor thin film transistor

Li-Feng Teng, Po‐Tsun Liu, Yuan-Jou Lo et al. · Applied Physics Letters · 2012 · 94 citations

Materials Science, Electrical Engineering, Engineering +13

Nitrogenated amorphous InGaZnO thin film transistor

Po‐Tsun Liu, Yi-Teh Chou, Li-Feng Teng et al. · Applied Physics Letters · 2011 · 90 citations

Materials Science, Electrical Engineering, Thin Film Transistor +11

Role of environmental and annealing conditions on the passivation-free in-Ga–Zn–O TFT

Chur-Shyang Fuh, Simon M. Sze, Po‐Tsun Liu et al. · Thin Solid Films · 2011 · 86 citations

Materials Science, Ii-vi Semiconductor, Engineering +5

Bipolar resistive switching characteristics of Al-doped zinc tin oxide for nonvolatile memory applications

Yang-Shun Fan, Po‐Tsun Liu, Li-Feng Teng et al. · Applied Physics Letters · 2012 · 47 citations

Materials Science, Materials Engineering, Electrical Engineering +12