Oxidation of silicon: the VLSI gate dielectric

C.J. Sofield, A. M. Stoneham

Semiconductor Science and Technology

EngineeringChemistrySilicon On InsulatorSemiconductor DeviceSemiconductors +14

Modification of high temperature and high performance polymers by ion implantation

Yongqiang Wang, S.S. Mohite, L.B. Bridwell, +2

Journal of materials research/Pratt's guide to venture capital sources

Materials ScienceIon ImplantationEngineeringPolymer TechnologyPolymer Science +6

Investigations of arcing in the DITE tokamak

Dominic Goodall, Thomas Conlon, C.J. Sofield, +1

Journal of Nuclear Materials

Magnetic Confinement FusionDite TokamakPhysics

An intercomparison of absolute measurements of the oxygen and tantalum thickness of tantalum pentoxide reference materials, BCR 261, by six laboratories

M. P. Seah, D. David, John Davies, +6

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Materials EngineeringInorganic ChemistryMaterials ScienceBcr 261Engineering +4

Ion implantation of polymers for electrical conductivity enhancement

L.B. Bridwell, R. E. Giedd, Y.Q. Wang, +5

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Materials ScienceElectroactive MaterialElectrical EngineeringIon ImplantationEngineering +5

Comparison of charge-changing cross sections in gaseous and solid targets

Clifton Woods, C.J. Sofield, N. E. B. Cowern, +2

Journal of Physics B Atomic and Molecular Physics

EngineeringTarget FabricationChemistryCharge TransportIon Process +14

Atomic force microscopy analysis of wool fibre surfaces in air and under water

J.A.A. Crossley, Christopher T. Gibson, L.D. Mapledoram, +6

Micron

Materials ScienceEngineeringFiber StructureMechanicsSurface Science +5

Ion beam modification of polymers

C.J. Sofield, S. Sugden, Judith L. Ing, +1

Vacuum

Materials ScienceEngineeringPolymer ScienceIon Beam ModificationIon Beam +3

Surface modification of MgO substrates from aqueous exposure: an atomic force microscopy study

Stephen A. Holt, Colin F. Jones, Gregory S. Watson, +4

Thin Solid Films

Materials ScienceSurface CharacterizationChemical EngineeringEngineeringSurface Chemistry +7

Energy straggling of 5.486-MeV alpha particles in Al

C.J. Sofield, N. E. B. Cowern, J.M. Freeman, +1

Physical review. A, General physics

Materials ScienceHeavy Ion PhysicEngineeringNuclear PhysicsPhysics +12