L. Boyer

Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

Frédéric Houzé, R. Meyer, Olivier Schneegans et al. · Applied Physics Letters · 1996 · 188 citations

Atomic Force Microscopy, Engineering, Microscopy +20

Contact resistance calculations: generalizations of Greenwood's formula including interface films

L. Boyer · IEEE Transactions on Components and Packaging Technologies · 2001 · 67 citations

Electrical Resistance, Engineering, Rough Electrodes +20

The influence of surface roughness on the capacitance between a sphere and a plane

L. Boyer, Frédéric Houzé, A. Tonck et al. · Journal of Physics D Applied Physics · 1994 · 55 citations

Electrical Engineering, Engineering, Surface Roughness +6

Electrical and mechanical contact between rough gold surfaces in air

A. Tonck, Frédéric Houzé, L. Boyer et al. · Journal of Physics Condensed Matter · 1991 · 36 citations

Electrohydrodynamics, Engineering, Mechanical Measurements +20

Study of the local electrical properties of metal surfaces using an AFM with a conducting probe

Olivier Schneegans, Frédéric Houzé, R. Meyer et al. · IEEE Transactions on Components Packaging and Manufacturing Technology Part A · 1998 · 32 citations

Engineering, Microscopy, Conducting Probe +19