J.H. Sim

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Active since

1992

Affiliations

J.H. Sim is an author at National Taiwan University specializing in semiconductor devices, device characterization, and complementary metal-oxide-semiconductor technology.

Publications per year

1992–1993

Publications

An analytical back-gate bias effect model for ultrathin SOI CMOS devices

J.H. Sim, J.B. Kuo · IEEE Transactions on Electron Devices · 1993 · 30 citations

Engineering, Electrical Engineering, Electronic Materials +16

Back-gate bias effect on the subthreshold behavior and the switching performance in an ultrathin SOI CMOS inverter operating at 77 and 300 K

J.B. Kuo, W.C. Lee, J.H. Sim · IEEE Transactions on Electron Devices · 1992 · 10 citations

Engineering, Electrical Engineering, Electronic Materials +14

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