Momčilo M. Pejović

Electrical breakdown in low pressure gases

Momčilo M. Pejović, Goran Ristić, J.P. Karamarković · Journal of Physics D Applied Physics · 2002 · 180 citations

Natural Sciences, Electrical Engineering, Physics +13

Sensitivity and fading of pMOS dosimeters with thick gate oxide

Goran Ristić, Snežana Golubović, Momčilo M. Pejović · Sensors and Actuators A Physical · 1995 · 52 citations

Engineering, Electrical Engineering, Materials Science +14

Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature

Milić M. Pejović, Momčilo M. Pejović, Momčilo M. Pejović et al. · Sensors and Actuators A Physical · 2011 · 46 citations

Engineering, Nuclear Engineering, Radiation Detection +15

Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method

Momčilo M. Pejović, Goran Ristić · Physics of Plasmas · 2002 · 44 citations

Natural Sciences, Electrical Engineering, Physics +17

Creation and passivation of interface traps in irradiated MOS transistors during annealing at different temperatures

Momčilo M. Pejović, Goran Ristić · Solid-State Electronics · 1997 · 39 citations

Engineering, Electrical Engineering, Materials Science +16