Statistics
Publications
9
Citations
134
H-Index
9
Active since
2006
Affiliations
Pranav Agarwal is an author at University of Minnesota specializing in scanning probe microscopy, atomic force microscopy, and atomic force microscopy analysis.
Publications per year
2006–2023
9
9
Real-time detection of probe loss in atomic force microscopy
Tathagata De, Pranav Agarwal, Deepak Ranjan Sahoo et al. · Applied Physics Letters · 2006 · 18 citations
Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method
Deepak Ranjan Sahoo, Pranav Agarwal, Murti V. Salapaka · Proceedings of the ... American Control Conference/Proceedings of the American Control Conference · 2007 · 16 citations
Engineering, Materials Science, Microelectromechanical Systems +14
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