Statistics
Publications
3
Citations
42
H-Index
3
Active since
2017
Affiliations
GlobalFoundries (United States)(Current)
Baofu Zhu is an author at GlobalFoundries (United States) specializing in semiconductor devices, device characterization, and engineering.
Publications per year
2017–2019
3
3
Influence of stress induced CT local layout effect (LLE) on 14nm FinFET
Pei Zhao, Shesh Mani Pandey, Edmund Banghart et al. · 2017 · 14 citations
Engineering, Electrical Engineering, Electronic Materials +12
HCI Improvement on 14nm FinFET IO Device by Optimization of 3D Junction Profile
Xinggon Wan, Baofu Zhu, Meera Mohan et al. · 2019 · 11 citations
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