J. D. Hong

cw laser anneal of polycrystalline silicon: Crystalline structure, electrical properties

A. Gat, L. Gerzberg, J. F. Gibbons et al. · Applied Physics Letters · 1978 · 228 citations

Engineering, Average Grain Size, Laser Applications +18

Solid solubility of As in Si as determined by ion implantation and cw laser annealing

A. Lietoila, J. F. Gibbons, T. J. Magee et al. · Applied Physics Letters · 1979 · 93 citations

Materials Science, Complete Electrical Activity, Electrical Engineering +15

Effect of grain size on thermal transport in post-annealed antimony telluride thin films

No‐Won Park, Won‐Yong Lee, J. D. Hong et al. · Nanoscale Research Letters · 2015 · 38 citations · Full text

Materials Science, High Temperature Materials, Engineering +13

Enhanced thermoelectric properties of thermal treated Sb2Te3 thin films

J. D. Hong, Sang‐Kwon Lee, Soon‐Gil Yoon · Journal of Alloys and Compounds · 2013 · 31 citations

Materials Science, Engineering, Applied Physics +6

Back surface gettering and Cr out-diffusion in VPE GaAs layers

T. J. Magee, Jiahui Peng, J. D. Hong et al. · Applied Physics Letters · 1979 · 24 citations

Surface Damage Gettering, Engineering, Vpe Layer +16