Concepedia

Byoung Hun Lee

BH

2

Publications

76

Citations

2

H-Index

2005

Active since

Affiliations

IBM Research - Austin(Current)

Byoung Hun Lee is an author at IBM Research - Austin specializing in microelectronics, electrical engineering, and engineering.

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Publications per year

2005–2011

2

Publications

2

Charge trapping and detrapping characteristics in hafnium silicate gate stack under static and dynamic stress

Rino Choi, Se Jong Rhee, J.C. Lee et al. · IEEE Electron Device Letters · 2005 · 47 citations

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Conduction Mechanism and Reliability Characteristics of a Metal–Insulator–Metal Capacitor with Single ZrO<sub>2</sub> Layer

Hyuk-Min Kwon, In Shik Han, Sang-Uk Park et al. · Japanese Journal of Applied Physics · 2011 · 29 citations

, , +11

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