Jang-Cheng Hsieh

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Active since

1996

Affiliations

Jang-Cheng Hsieh is an author at National Cheng Kung University specializing in gate oxide degradation, device characterization, and semiconductor devices.

Publications per year

1996–2009

Publications

New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate

Chung-Yun Cheng, Yean-Kuen Fang, Jang-Cheng Hsieh et al. · IEEE Transactions on Electron Devices · 2009 · 16 citations

Engineering, Electrical Engineering, Microelectronics +16

Improvement on Fluorine Effect under High Field Stress in Tungsten-Polycide Gated Metal-Oxide-Semiconductor Field-Effect Transistor with Oxynitride and/or Reoxidized-Oxynitride Gate Dielectric

Chii‐Wen Chen, Yean-Kuen Fang, Kan-Yuan Lee et al. · Japanese Journal of Applied Physics · 1996 · 10 citations

Engineering, Electrical Engineering, Materials Science +17

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