In Sang Jeon

Post-Annealing Effects on Fixed Charge and Slow/Fast Interface States of TiN/Al₂O₃/p-Si Metal–Oxide–Semiconductor Capacitor

In Sang Jeon, Jaehoo Park, Dail Eom et al. · Japanese Journal of Applied Physics · 2003 · 53 citations

Materials Science, Semiconductors, Electrical Engineering +13

Investigation of interface trap states in TiN/Al2O3/p-Si capacitor by deep level transient spectroscopy

In Sang Jeon, Jaehoo Park, Dail Eom et al. · Applied Physics Letters · 2003 · 30 citations

Engineering, Minority Carrier, Silicon On Insulator +19

Impact of the crystallization of the high-k dielectric gate oxide on the positive bias temperature instability of the n-channel metal-oxide-semiconductor field emission transistor

Han Jin Lim, Youngkuk Kim, In Sang Jeon et al. · Applied Physics Letters · 2013 · 10 citations

Electrical Engineering, Semiconductor Device, Engineering +13

Atomic Layer Deposition- and Chemical Vapor Deposition-TiN Top Electrode Optimization for the Reliability of Ta₂O₅ and Al₂O₃ Metal Insulator Silicon Capacitor for 0.13 µm Technology and Beyond

Hyun Seok Lim, Sang Bom Kang, In Sang Jeon et al. · Japanese Journal of Applied Physics · 2001 · 10 citations

Engineering, µM Technology, Thin Film Process Technology +18