Concepedia

G. S. Prokop

GS

4

Publications

105

Citations

4

H-Index

1972

Active since

Affiliations

IBM (United States)(Current)

G. S. Prokop is an author at IBM (United States) specializing in applied physics, electronic packaging, and microelectronics.

Top concepts

EngineeringApplied PhysicsMicroelectronicsElectronic PackagingSurface ScienceMicrofabricationElectrical InsulationElectrical EngineeringCorrosionThin Films

Publications per year

1972–1984

4

Publications

4

The role of metal and passivation defects in electromigration-induced damage in thin film conductors

James R. Lloyd, Paul Smith, G. S. Prokop · Thin Solid Films · 1982 · 51 citations

Materials Science, Electromigration Technique, Passivation Defects +12

The relationship among electromigration, passivation thickness, and common-emitter current gain degradation within shallow junction NPN bipolar transistors

Richard S. Hemmert, G. S. Prokop, J. R. Lloyd et al. · Journal of Applied Physics · 1982 · 24 citations · Full text

Electromigration Failure at Aluminum-Silicon Contacts

G. S. Prokop, R. R. Joseph · Journal of Applied Physics · 1972 · 18 citations

Electrical Engineering, Electromigration Technique, Engineering +13

Lot-to-lot variations in electromigration performance for thin film microcircuits

Paul Smith, J. R. Lloyd, G. S. Prokop · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1984 · 12 citations

Advanced Packaging, Reliability, Electrical Engineering +15

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