R. Reif - Concepedia

Author

R. Reif

Massachusetts Institute of Technology

Also Known As

R Reif, R. REIF, R. Reif, RAFAEL REIF, Rafael Reif, Rafael Reif Rafael Reif, Reep, M., Reif, R.

Publications

2.9K

Citations

H-Index

Concepts

All Affiliations

Massachusetts Institute of Technology Stanford University Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory University of California, Santa Barbara

About

R. Reif is an author at Massachusetts Institute of Technology specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	18	26	2.1K
2	Applied Physics	15	20	632
3	Natural Sciences	3	3	244
4	Education	1	1	14
5	Health Sciences	1	1	17

R. Reif

Publications

2.5K

Citations

H-Index

Page 1

	Year	Citations
The BABAR detector B. Aubert, A. Bazan, A. Boucham, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Image AnalysisMachine VisionEngineeringPattern RecognitionDetector Physic	2002	1.3K
The DIRC particle identification system for the BaBar experiment R. Aleksan, L. Amerman, E. Antokhin, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Babar ExperimentPhysicsNatural SciencesParticle PhysicsParticle Method	2004	215
Polysilicon thin-film transistors with channel length and width comparable to or smaller than the grain size of the thin film N. Yamauchi, J.J. Hajjar, R. Reif IEEE Transactions on Electron Devices Electrical EngineeringElectronic DevicesEngineeringSemiconductor DeviceMicrofabrication	1991	123
Electromechanical coupling constant extraction of thin-film piezoelectric materials using a bulk acoustic wave resonator R. Naik, J.J. Lutsky, R. Reif, IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control EngineeringAcoustic MetamaterialMechanical EngineeringThin-film Piezoelectric MaterialsPiezoelectric Material	1998	86
Stochastic model for grain size versus dose in implanted and annealed polycrystalline silicon films on SiO2 R.B. Iverson, R. Reif Journal of Applied Physics	1985	56
Test of a large scale prototype of the DIRC, a Čherenkov imaging detector based on total internal reflection for BaBar at PEP-II R. Aleksan, L. Amerman, D. Aston, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment čHerenkov Imaging DetectorRadiation DetectionParticle PhysicsLarge Scale PrototypeInstrumentation	1997	55
A sonar-based technique for the ratiometric determination of binary gas mixtures G. D. Hallewell, G. Crawford, D. McShurley, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Ratiometric DeterminationSonar-based TechniqueBinary Gas MixturesMeasurement	1988	49
Effects of Ge on Material and Electrical Properties of Polycrystalline Si1 − x Ge x for Thin‐Film Transistors Julie A. Tsai, Andrew J. Tang, Takashi Noguchi, Journal of The Electrochemical Society EngineeringThin Film Process TechnologyElectrical PropertiesSemiconductor DeviceElectronic Devices	1995	49
The DIRC detector at BaBar R. Aleksan, D. Aston, P. Bailly, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Detector PhysicParticle PhysicsDirc Detector	1999	43
Segregation of Arsenic to the Grain Boundaries in Polycrystalline Silicon B. Swaminathan, E. Demoulin, T. W. Sigmon, Journal of The Electrochemical Society Materials ScienceEngineeringCrystalline DefectsPhysicsSurface Science	1980	41

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