Yoshiyuki Hisada

Transmission electron microscope study of a threading dislocation with and its effect on leakage in a 4H–SiC MOSFET

Shoichi Onda, H. Watanabe, Yasuo Kito et al. · Philosophical Magazine Letters · 2013 · 41 citations

Reconstructions of 6H-SiC(0001) Surfaces Studied by Scanning Tunneling Microscopy and Reflection High-Energy Electron Diffraction

Yoshiyuki Hisada, Kazuhiko Hayashi, Kiyoshige Kato et al. · Japanese Journal of Applied Physics · 2001 · 16 citations

Materials Science, Surface Characterization, Engineering +13

Structural analysis of 6H–SiC( 0001 ) surface by RHEED rocking curves

Tomohiro Aoyama, Yujie Han, Ayahiko Ichimiya et al. · Surface Science · 2001 · 11 citations

Materials Science, Surface Characterization, Engineering +6

The (×)R30° reconstruction on hexagonal 6H–SiC(0001) surface with and without a Si flux

Yujie Han, Tomohiro Aoyama, Ayahiko Ichimiya et al. · Surface Science · 2001 · 11 citations

Materials Science, Materials Engineering, Hexagonal 6H–sic +7

Structural Study of the SiC(0001)(√3×√3)-R30\degree Surfaces by Reflection High-Energy Electron Diffraction Rocking Curves

Tomohiro Aoyama, Yoshiyuki Hisada, Shinichi Mukainakano et al. · Japanese Journal of Applied Physics · 2002 · 10 citations

Materials Science, Semiconductors, C Honeycomb Structure +12