Dohyun Baek

Effects of electron trapping and interface state generation on bias stress induced in indium–gallium–zinc oxide thin-film transistors

Chang‐Hoon Han, Sangsub Kim, Kwang-Ryul Kim et al. · Japanese Journal of Applied Physics · 2014 · 30 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of off-State Stress and Drain Relaxation Voltage on Degradation of a Nanoscale nMOSFET at High Temperature

Nam-Hyun Lee, Dohyun Baek, Bongkoo Kang · IEEE Electron Device Letters · 2011 · 25 citations

Engineering, Electrical Engineering, Microelectronics +16

A Study on the Electrical Characteristic Analysis of c-Si Solar Cell Diodes

Pyungho Choi, Hyojung Kim, Dohyun Baek et al. · JSTS Journal of Semiconductor Technology and Science · 2012 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of various encapsulants for frameless glass to glass Cu(In,Ga)(Se,S)₂ photovoltaic module

JungYup Yang, Dongho Lee, Dohyun Baek et al. · RSC Advances · 2015 · 19 citations

Natural Sciences, Materials Engineering, Materials Science +11

Influence of surface properties on the performance of Cu(In,Ga)(Se,S)₂thin-film solar cells using Kelvin probe force microscopy

JungYup Yang, Dongho Lee, Kwang-Soo Huh et al. · RSC Advances · 2015 · 15 citations

Natural Sciences, Materials Engineering, Materials Science +17