Statistics
Publications
1
Citations
17
H-Index
1
Active since
2007
Affiliations
National Institute of Metrology(Current)
Hongtang Gao is an author at National Institute of Metrology specializing in optics, surface topography mapping, and force sensing.
Publications per year
2007–2007
1
1
An atomic force microscope head designed for nanometrology
Mingzhen Lu, Sitian Gao, Qihai Jin et al. · Measurement Science and Technology · 2007 · 17 citations
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