Statistics
Publications
1
Citations
17
H-Index
1
Active since
2007
Affiliations
National Institute of Metrology(Current)
Qihai Jin is an author at National Institute of Metrology specializing in mechanical measurement, force sensing, and engineering.
Publications per year
2007–2007
1
1
An atomic force microscope head designed for nanometrology
Mingzhen Lu, Sitian Gao, Qihai Jin et al. · Measurement Science and Technology · 2007 · 17 citations
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