C.A. Musca

Determination of mechanical properties of PECVD silicon nitride thin films for tunable MEMS Fabry–Pérot optical filters

Han Huang, K.J. Winchester, Yinong Liu et al. · Journal of Micromechanics and Microengineering · 2005 · 73 citations

Intrinsic Stress Gradient, Optical Materials, Engineering +20

HgCdTe mid-wavelength IR photovoltaic detectors fabricated using plasma induced junction technology

J.M. Dell, J. Antoszewski, M. H. Rais et al. · Journal of Electronic Materials · 2000 · 55 citations

Wide-bandgap Semiconductor, Electrical Engineering, Plasma Electronics +7

Current status and issues in the surface passivation technology of mercury cadmium telluride infrared detectors

O.P. Agnihotri, C.A. Musca, L. Faraone · Semiconductor Science and Technology · 1998 · 46 citations

Engineering, Chemistry, Surface Passivation Technology +21

Generation-recombination effects on dark currents in CdTe-passivated midwave infrared HgCdTe photodiodes

A. Jóźwikowska, K. Jóźwikowski, J. Antoszewski et al. · Journal of Applied Physics · 2005 · 41 citations

Wide-bandgap Semiconductor, Engineering, Optoelectronic Devices +20

Stress in low-temperature plasma enhanced chemical vapour deposited silicon nitride thin films

Mariusz Martyniuk, J. Antoszewski, C.A. Musca et al. · Smart Materials and Structures · 2005 · 41 citations