L. Johann

Fixed polarizer, rotating-polarizer and fixed analyzer spectroscopic ellipsometer: accurate calibration method, effect of errors and testing

Aotmane En Naciri, Laurent Broch, L. Johann et al. · Thin Solid Films · 2002 · 24 citations

Organic Photonics, Engineering, Calibration +8

Systematic errors in fixed polarizer, rotating polarizer, sample, fixed analyzer spectroscopic ellipsometry

S. Bertucci, A.-G. Pawlowski, Natalie J. Nicolas et al. · Thin Solid Films · 1998 · 22 citations

Engineering, Measurement, Calibration +10

Dielectric function of germanium nanocrystals between 0.6 and 6.5eV by spectroscopic ellipsometry

M.B.A. Mansour, Aotmane En Naciri, L. Johann et al. · Journal of Physics and Chemistry of Solids · 2006 · 19 citations

Materials Science, Dielectric Function, Ii-vi Semiconductor +10

Structural and spectroscopic ellipsometry characterization for electrodeposited ZnO growth at different hydrogen peroxide concentration

A. El Hichou, Nicolas Stein, C. Boulanger et al. · Thin Solid Films · 2009 · 17 citations

Materials Science, Engineering, Electrodeposited Zno Growth +8

Optimizing precision of rotating compensator ellipsometry

Laurent Broch, L. Johann · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2008 · 15 citations

Engineering, Measurement, Education +16