Toshio Sakurai Toshio Sakurai

Field Ion-Scanning Tunneling Microscopy Study of C₆₀ on the Si(100) Surface

Tomihiro Hashizume, Xiang-Dong Wang, Yūichirō Nishina et al. · Japanese Journal of Applied Physics · 1992 · 152 citations

Natural Sciences, Materials Science, Physics +16

C₆₀ Grown on the Cu(111)1×1 Surface

Kumi Motai, Tomihiro Hashizume, Hisanori Shinohara et al. · Japanese Journal of Applied Physics · 1993 · 75 citations

Natural Sciences, Chemistry, Materials Science +17

Field Ion-Scanning Tunneling Microscopy Study of the Ag(110)-O System

Tomihiro Hashizume, Masahiro Taniguchi, Kumi Motai et al. · Japanese Journal of Applied Physics · 1991 · 57 citations

Natural Sciences, Chemistry, Materials Science +14

The Absolute Coverage of K on the Si(111)-3×1-K Surface

Tomihiro Hashizume, Mitsuhiro Katayama, Dongryul Jeon et al. · Japanese Journal of Applied Physics · 1993 · 45 citations

Natural Sciences, Materials Science, Physics +15

Ordering of Missing-Row-Defects Forming (2×n)-Bi Phases on the Si(100) 2×1 Surface Studied by the Scanning Tunneling Microscopy

Chan Park, Raoulf Z. Bakhtizin, Tomihiro Hashizume Tomihiro Hashizume et al. · Japanese Journal of Applied Physics · 1993 · 30 citations

Natural Sciences, Materials Science, Physics +17