Kitaek Kang

Three Dimensional Stress Mapping of Silicon Surrounded by Copper Filled through Silicon Vias Using Polychromator-Based Multi-Wavelength Micro Raman Spectroscopy

A. D. Trigg, Li Yu, Cheng Kuo Cheng et al. · Applied Physics Express · 2010 · 47 citations · Full text

Engineering, Silicon On Insulator, Interconnect (Integrated Circuits) +19

Temperature Dependence of Photoluminescence Spectra from Crystalline Silicon

Woo Sik Yoo, Kitaek Kang, Gota Murai et al. · ECS Journal of Solid State Science and Technology · 2015 · 37 citations · Full text

Standard Gaussian Function, Optical Materials, Engineering +16

Image-Based Quantitative Analysis of Foxing Stains on Old Printed Paper Documents

Gyuho Kim, Jung Gon Kim, Kitaek Kang et al. · Heritage · 2019 · 37 citations · Full text

Art History, Image Analysis, Engineering +11

Thermal Behavior of Large-Diameter Silicon Wafers during High-Temperature Rapid Thermal Processing in Single Wafer Furnace

Woo Sik Yoo, Takashi Fukada, Ichiro Yokoyama et al. · Japanese Journal of Applied Physics · 2002 · 30 citations

Engineering, Integrated Circuits, Silicon On Insulator +22

Extraction of Color Information and Visualization of Color Differences between Digital Images through Pixel-by-Pixel Color-Difference Mapping

Woo Sik Yoo, Kitaek Kang, Jung Gon Kim et al. · Heritage · 2022 · 24 citations · Full text

Image Processing, Image Analysis, Color Differences +13