N. W. Jang

Effect of thickness of ZnO active layer on ZnO-TFT's characteristics

Jihoon Chung, J.Y. Lee, Hong‐Gyu Kim et al. · Thin Solid Films · 2007 · 83 citations

Natural Sciences, Electrical Engineering, Materials Science +12

Structural and electrical characteristics of (Pb1−xLax)(Zr0.5Ti0.5)O3 thin film capacitors

Suk-Bum Mah, N. W. Jang, J.H Park et al. · Materials Research Bulletin · 2000 · 18 citations

Natural Sciences, Materials Engineering, Materials Science +14

Electrical properties of highly reliable plug buffer layer for high-density ferroelectric memory

Yoon J. Song, Bonjae Koo, June Key Lee et al. · Applied Physics Letters · 2002 · 12 citations

Engineering, Electrical Engineering, Materials Science +17

Novel integration technologies for highly manufacturable 32 Mb FRAM

H.H. Kim, Y. J. Song, Sangyoon Lee et al. · 2003 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +13

Advanced Integration Process Technology for Highly Reliable Ferroelectric Devices

Youjian Song, H.Y. Kang, H. J. Joo et al. · Integrated ferroelectrics · 2004 · 10 citations

Natural Sciences, Materials Engineering, Materials Science +17