M. Horn von Hoegen

Detection of Nonthermal Melting by Ultrafast X-ray Diffraction

C. W. Siders, A. Cavalleri, K. Sokolowski-Tinten et al. · Science · 1999 · 543 citations

Materials Science, X-ray Spectroscopy, Engineering +13

Influence of surfactants in Ge and Si epitaxy on Si(001)

M. Copel, M. C. Reuter, M. Horn von Hoegen et al. · Physical review. B, Condensed matter · 1990 · 344 citations

Materials Engineering, Materials Science, Engineering +12

Femtosecond X-Ray Measurement of Ultrafast Melting and Large Acoustic Transients

K. Sokolowski-Tinten, C. Blome, C. Dietrich et al. · Physical Review Letters · 2001 · 265 citations

X-ray Spectroscopy, Engineering, Nonthermal Melting +18

Anharmonic Lattice Dynamics in Germanium Measured with Ultrafast X-Ray Diffraction

A. Cavalleri, C. W. Siders, Frank L. H. Brown et al. · Physical Review Letters · 2000 · 147 citations

A new two-dimensional particle detector for a toroidal electrostatic analyzer

R. M. Tromp, M. Copel, M. C. Reuter et al. · Review of Scientific Instruments · 1991 · 107 citations

Engineering, Nuclear Physics, Ion Beam Instrumentation +18