Y. Murai

A 288-kb fully parallel content addressable memory using a stacked-capacitor cell structure

T. Yamagata, M. Mihara, T. Hamamoto et al. · IEEE Journal of Solid-State Circuits · 1992 · 50 citations

Engineering, Memory Design, Vlsi Design +18

Statistical Property of Breakdown Between Metal Electrodes in Vacuum

H. Toya, Natsuki Ueno, Toshio Okada et al. · IEEE Transactions on Power Apparatus and Systems · 1981 · 37 citations

Electrode Surface, Electrical Engineering, Electromigration Technique +10

Anode discharge mode and cathodic plasma state in high-current vacuum arcs

H. Toya, Y. Uchida, Tatsuya Hayashi et al. · Journal of Applied Physics · 1986 · 31 citations

Electrical Engineering, Plasma Electronics, Engineering +15

Statistical Property of the Breakdown of Vacuum Circuit Breakers and its Influence on the Surge Generation in Capacitive and Reactive Current Interruption

Y. Murai, H. Toya, T. Nitta · IEEE Transactions on Power Apparatus and Systems · 1979 · 26 citations

Electrical Engineering, Reactive Current Interruption, Engineering +12

Self-Flow Generation Phenomena in a Gas Circuit Breaker Without Puffer Action

Y. Ueda, H. Sasao, Y. Murai et al. · IEEE Transactions on Power Apparatus and Systems · 1981 · 23 citations

Gas Circuit Breakers, Electrical Engineering, Puffer Cylinder +7