Birk Heinze

Surge Current Ruggedness of Silicon Carbide Schottky- and Merged-PiN-Schottky Diodes

Birk Heinze, Josef Lutz, Matthias Neumeister et al. · 2008 · 58 citations

Engineering, Electrical Engineering, Materials Science +17

The $\hbox{nn}^{+}$-Junction as the Key to Improved Ruggedness and Soft Recovery of Power Diodes

Josef Lutz, Roman Baburske, Min Chen et al. · IEEE Transactions on Electron Devices · 2009 · 53 citations

Engineering, Electrical Engineering, Materials Science +17

Charge-Carrier Plasma Dynamics During the Reverse-Recovery Period in $\hbox{p}^{+}$-$\hbox{n}^{-}$ -$\hbox{n}^{+}$ Diodes

Roman Baburske, Birk Heinze, Josef Lutz et al. · IEEE Transactions on Electron Devices · 2008 · 30 citations

Engineering, Electrical Engineering, Physics +14

On the formation of stationary destructive cathode-side filaments in p<inf>+</inf>-n<inf>−</inf>-n<sup>+</sup> diodes

Roman Baburske, Birk Heinze, F.‐J. Niedernostheide et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 2009 · 25 citations

Natural Sciences, Electrical Engineering, Materials Science +9

Effects of negative differential resistance in high power devices and some relations to DMOS structures

Roman Baburske, Josef Lutz, Birk Heinze · 2010 · 22 citations

Engineering, Electrical Engineering, Physics +14