Kwang-Pyuk Suh

Negative bias temperature instability in triple gate transistors

S. Maeda, Jung-A Choi, Jeong-Hwan Yang et al. · 2004 · 37 citations

Engineering, Electrical Engineering, Microelectronics +16

Ultrathin gate oxide grown on nitrogen-implanted silicon for deep submicron CMOS transistors

Inho Nam, Jae Sung Sim, Sung In Hong et al. · IEEE Transactions on Electron Devices · 2001 · 19 citations

Engineering, Electrical Engineering, Electronic Materials +16

An experimental 16-Mbit DRAM with reduced peak-current noise

Daeje Chin, Changhyun Kim, Yunho Choi et al. · IEEE Journal of Solid-State Circuits · 1989 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17

Improvement of NBTI and electrical characteristics by ozone pre-treatment and PBTI issues in HfAlO(N) high-k gate dielectrics

Seok Joo Doh, Hyung‐Suk Jung, Yunseok Kim et al. · 2004 · 14 citations

Engineering, Electrical Engineering, Materials Science +17

Mass-productive ultra-low temperature ALD SiO/sub 2/ process promising for sub-90 nm memory and logic devices

Jae-Eun Park, Ja-Hum Ku, Joo-Won Lee et al. · 2003 · 11 citations

Engineering, Materials Engineering, Materials Science +13