F. Pellerin

An important step in quantitative auger analysis: The use of peak to background ratio

J.P. Langeron, L. Minel, J.-L. Vignes et al. · Surface Science · 1984 · 78 citations

Engineering, Radiology, Instrumentation +5

Simulation of the LMM auger spectra of copper

Pierre Dubot, D. Jousset, Véronique Pinet et al. · Surface and Interface Analysis · 1988 · 75 citations

Natural Sciences, Materials Engineering, Materials Science +16

A secondary electron spectroscopy and electron energy loss spectroscopy study of the interaction of oxygen with a polycrystalline aluminum surface

F. Pellerin, C. Le Gressus, D. Massignon · Surface Science · 1981 · 20 citations

Natural Sciences, Materials Engineering, Materials Science +16

Summary Abstract: High energy resolution Auger electron spectroscopy of Ti and TiN

F. Pellerin, C. Bodin, T. Pech · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1987 · 17 citations

Natural Sciences, Materials Engineering, Materials Science +9

Comparison of the secondary-electron spectrum with the electron-loss spectrum on pure Al by low-energy electron-reflection spectroscopy

D. Massignon, F. Pellerin, J.M. Fontaine et al. · Journal of Applied Physics · 1980 · 15 citations

Natural Sciences, Materials Science, Physics +16