J.P. Langeron

Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors

Shingo Ichimura, Ryōsuke Shimizu, J.P. Langeron · Surface Science · 1983 · 94 citations

Engineering, Electron Microscopy, Physics +10

An important step in quantitative auger analysis: The use of peak to background ratio

J.P. Langeron, L. Minel, J.-L. Vignes et al. · Surface Science · 1984 · 78 citations

Important Step, Image Analysis, Health Sciences +6

Quantitative approach of Auger electron spectrometry

Frédéric Pons, J. Le Héricy, J.P. Langeron · Surface Science · 1977 · 75 citations

Atomic Emission Spectroscopy, Electron Spectroscopy, Natural Sciences +7

Simulation of the LMM auger spectra of copper

Pierre Dubot, D. Jousset, Véronique Pinet et al. · Surface and Interface Analysis · 1988 · 73 citations

Electrical Engineering, Engineering, Physics +15

Study by Auger Spectrometry and Cathodic Reduction of Passive Films Formed on Ferritic Stainless Steels

M. Da Cunha Belo, B. Rondot, Frédéric Pons et al. · Journal of The Electrochemical Society · 1977 · 66 citations

Materials Science, Materials Engineering, Chemical Engineering +14