Dong Un Jin

The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide thin film transistors

Jaeseob Lee, Jin‐Seong Park, Young Shin Pyo et al. · Applied Physics Letters · 2009 · 171 citations

Materials Science, Gate Dielectrics, Electrical Engineering +14

Flexible Full-Color AMOLED on Ultrathin Metal Foil

Jae Kyeong Jeong, Dong Un Jin, Hyun Soo Shin et al. · IEEE Electron Device Letters · 2007 · 59 citations

Optical Materials, Engineering, Organic Electronics +21

Electrical Instability of a-In–Ga–Zn–O TFTs Biased Below Accumulation Threshold

Denis Stryakhilev, Jin‐Seong Park, Jaeseob Lee et al. · Electrochemical and Solid-State Letters · 2009 · 32 citations

Electrical Engineering, Electronic Devices, Engineering +14

64.1: 5.6‐inch Flexible Full Color Top Emission AMOLED Display on Stainless Steel Foil

Dong Un Jin, Jae Kyeong Jeong, Hyun Soo Shin et al. · SID Symposium Digest of Technical Papers · 2006 · 29 citations

Flexible AMOLED displays on stainless‐steel foil

Dong Un Jin, Jae Kyeong Jeong, Tae-Woong Kim et al. · Journal of the Society for Information Display · 2006 · 14 citations