U. Kaiser

Quantitative depth profile and bulk analysis with high dynamic range by electron gas sputtered neutral mass spectrometry

R. Jede, H. Peters, Guido Dünnebier et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1988 · 85 citations

Natural Sciences, Chemistry, Physics +15

Quasisimultaneous SIMS, AES, XPS, and TDMS study of preferential sputtering, diffusion, and mercury evaporation in CdxHg1−xTe

H. M. Nitz, U. Kaiser, L. Wiedmann et al. · Surface Science · 1981 · 72 citations

Natural Sciences, Materials Engineering, Materials Science +9

Quantitative Measurement of the Magnetic Exchange Interaction across a Vacuum Gap

R. Schmidt, Cesar Lazo, U. Kaiser et al. · Physical Review Letters · 2011 · 52 citations

Natural Sciences, Materials Science, Physics +17

Depth profile analysis of hydrogenated carbon layers on silicon by x-ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy-loss spectroscopy, and secondary ion mass spectrometry

P. Sander, U. Kaiser, M. Altebockwinkel et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1987 · 42 citations

Natural Sciences, Materials Engineering, Materials Science +17

Oxidation of cobalt at room temperature, studied by combined static SIMS, static AES, XPS and work function investigations

Naili Wang, U. Kaiser, L. Wiedmann et al. · Surface Science · 1983 · 39 citations

Natural Sciences, Materials Engineering, Materials Science +9