M. C. Maya-Sánchez

A New and Better Method for Extracting the Parasitic Elements of On-Wafer GaN Transistors

Andrés Zárate-de Landa, J. E. Zúñiga‐Juárez, J. A. Reynoso‐Hernández et al. · IEEE MTT-S International Microwave Symposium digest · 2007 · 17 citations

Wide-bandgap Semiconductor, Electrical Engineering, On-wafer Gan Transistors +13

Using lines of arbitrary impedance as standards on the TRL calibration technique

J. A. Reynoso‐Hernández, M. A. Pulido-Gaytan, Andrés Zárate-de Landa et al. · 2013 · 16 citations

Engineering, Measurement, Measurement Standards (Educational Assessment) +17

An improved two-tier L-L method for characterizing symmetrical microwave test fixtures

J. E. Zúñiga‐Juárez, J. A. Reynoso‐Hernández, J. R. Loo‐Yau et al. · Measurement · 2011 · 15 citations

Electrical Engineering, Engineering, Measurement +7

An improved multiline TRL method

J. E. Zúñiga‐Juárez, J. A. Reynoso‐Hernández, M. C. Maya-Sánchez · 2006 · 15 citations

Numerical Analysis, Wireless Communications, Engineering +18

Experimental Investigation of Resistive–Reactive Class-J Mode Using Time-Domain Low-Frequency Active Harmonic Load–Pull Measurements

Marlon Molina‐Ceseña, J. A. Reynoso‐Hernández, M. A. Pulido-Gaytan et al. · IEEE Microwave and Wireless Components Letters · 2021 · 11 citations