San Lein Wu - Concepedia

Author

San Lein Wu

National Cheng Kung University

Also Known As

San Lein Wu, San-Lein Wu

Publications

275

Citations

H-Index

Concepts

All Affiliations

National Cheng Kung University Cheng Shiu University United Microelectronics (Taiwan)

About

San Lein Wu is an author at National Cheng Kung University specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	159
2	Applied Physics	9	9	144
3	Electrical Engineering	8	8	129
4	Computer Engineering	1	1	15
5	Materials Science	1	1	20

San Lein Wu

Publications

175

Citations

H-Index

Page 1

	Year	Citations
Comparison of the trap behavior between ZrO<sub>2</sub> and HfO<sub>2</sub> gate stack nMOSFETs by 1/f noise and random telegraph noise Bo Chin Wang, San Lein Wu, Yu Ying Lu, IEEE Electron Device Letters Noise CharacteristicsElectrical EngineeringEngineeringNoise ControlRandom Telegraph Noise	2012	33
Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors Chung-Wei Liu, Shoou-Jinn Chang, Chih-Hung Hsiao, IEEE Journal of Selected Topics in Quantum Electronics Materials ScienceOptical MaterialsEngineeringNanomaterialsNanotechnology	2014	20
GaN‐based Schottky barrier ultraviolet photodetector with a 5‐pair AlGaN–GaN intermediate layer Kai Hsuan Lee, Ping Chuan Chang, Shoou‐Jinn Chang, physica status solidi (a)	2011	16
Low-Frequency Noise Characteristics in Strained-Si nMOSFETs Yen Ping Wang, San Lein Wu, Shoou‐Jinn Chang IEEE Electron Device Letters Electrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsBias Temperature Instability	2007	16
Enhanced CMOS performances using substrate strained-SiGe and mechanical strained-Si technology San Lein Wu, Yu Min Lin, Shoou‐Jinn Chang, IEEE Electron Device Letters Electrical EngineeringMechanical Tensile StressEngineeringVlsi DesignNovel Cmos Architecture	2005	15
SiGe heterostructure field-effect transistor using V-shaped confining potential well Yu Min Lin, San Lein Wu, Shoou‐Jinn Chang, IEEE Electron Device Letters Electrical EngineeringEngineeringConducting ChannelUpper BoronNanoelectronics	2003	15
Low-Frequency Noise Characteristics for Various ${\rm ZrO}_{2}$-Added ${\rm HfO}_{2}$-Based 28-nm High-$k$/Metal-Gate nMOSFETs Shih Chang Tsai, Po‐Chin Huang, Jone F. Chen, IEEE Electron Device Letters Electrical EngineeringEngineeringRf Semiconductor\Rm ZroNanoelectronics	2013	14
Correlation Between Random Telegraph Noise and $ \hbox{1}/f$ Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain Bo Chin Wang, San Lein Wu, Chien Wei Huang, IEEE Electron Device Letters Electrical EngineeringEngineeringNanoelectronicsElectronic EngineeringTrap Position	2012	13
Impact of oxygen annealing on high-k gate stack defects characterized by random telegraph noise Hsu Feng Chiu, San Lein Wu, Yee Shyi Chang, Applied Physics Letters Defect ToleranceElectrical EngineeringTrap EnergyEngineeringRandom Telegraph Noise	2012	12
Controlled misfit dislocation technology in strained silicon MOSFETs San Lein Wu, Yen Ping Wang, Shoou‐Jinn Chang Semiconductor Science and Technology Advanced Integration FlowElectrical EngineeringStrained Silicon MosfetsEngineeringStrained-si Nmosfets	2005	11

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