San Lein Wu

Comparison of the trap behavior between ZrO₂ and HfO₂ gate stack nMOSFETs by 1/f noise and random telegraph noise

Bo Chin Wang, San Lein Wu, Yu Ying Lu et al. · IEEE Electron Device Letters · 2012 · 33 citations

Noise Characteristics, Electrical Engineering, Engineering +13

Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors

Chung-Wei Liu, Shoou-Jinn Chang, Chih-Hung Hsiao et al. · IEEE Journal of Selected Topics in Quantum Electronics · 2014 · 20 citations

Materials Science, Optical Materials, Engineering +10

GaN‐based Schottky barrier ultraviolet photodetector with a 5‐pair AlGaN–GaN intermediate layer

Kai Hsuan Lee, Ping Chuan Chang, Shoou‐Jinn Chang et al. · physica status solidi (a) · 2011 · 16 citations

Low-Frequency Noise Characteristics in Strained-Si nMOSFETs

Yen Ping Wang, San Lein Wu, Shoou‐Jinn Chang · IEEE Electron Device Letters · 2007 · 16 citations

Electrical Engineering, Semiconductor Device, Engineering +11

Enhanced CMOS performances using substrate strained-SiGe and mechanical strained-Si technology

San Lein Wu, Yu Min Lin, Shoou‐Jinn Chang et al. · IEEE Electron Device Letters · 2005 · 15 citations

Electrical Engineering, Mechanical Tensile Stress, Engineering +11