Sven Martin

Pulsed top-hat beam thermal-lens measurement for ultraviolet dielectric coatings

Bincheng Li, Sven Martin, E. Welsch · Optics Letters · 1999 · 28 citations

In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens

Bincheng Li, Sven Martin, E. Welsch · Applied Optics · 2000 · 23 citations

Optical Materials, Engineering, Optical Testing +19

Results of a round-robin experiment in multiple-pulse LIDT measurement with ultrashort pulses

K. Starke, Detlev Ristau, Sven Martin et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 18 citations

Engineering, Laser Science, Measurement +19

<title>Comparative study of the UV-optical and structural properties of SiO<formula><inf><roman>2</roman></inf></formula>, Al<formula><inf><roman>2</roman></inf></formula>O<formula><inf><roman>3</roman></inf></formula>, and HfO<formula><inf><roman>2</roman></inf></formula> single layers deposited by reactive evaporation, ion-assisted deposition, and plasma-ion-assisted deposition</title>

Roland Thielsch, Alexandre Gatto, Joerg Heber et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 15 citations

WLCD: a new system for wafer level CD metrology on photomasks

Sven Martin, Holger Seitz, Wolfgang Degel et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009 · 14 citations

Engineering, Optical Testing, Wafer Fab +16