Bincheng Li

Measuring the anisotropic thermal diffusivity of silicon nitride grains by thermoreflectance microscopy

Bincheng Li, L. T. Le Pottier, J.P. Roger et al. · Journal of the European Ceramic Society · 1999 · 77 citations

Materials Science, Engineering, Silicon Nitride Grains +11

Complete thermal characterization of film-on-substrate system by modulated thermoreflectance microscopy and multiparameter fitting

Bincheng Li, J.P. Roger, L. T. Le Pottier et al. · Journal of Applied Physics · 1999 · 69 citations

Optical Materials, Engineering, Microscopy +26

Measurement accuracy analysis of photocarrier radiometric determination of electronic transport parameters of silicon wafers

Bincheng Li, Derrick Shaughnessy, Andreas Mandelis · Journal of Applied Physics · 2004 · 50 citations · Full text

Engineering, Measurement, Education +19

A highly powerful calibration method for robotic smoothing system calibration via using adaptive residual extended Kalman filter

Yonghong Deng, Xi Hou, Bincheng Li et al. · Robotics and Computer-Integrated Manufacturing · 2023 · 45 citations

Sensor Calibration, State Estimation, Adaptive Residual +14

Accuracy of photocarrier radiometric measurement of electronic transport properties of ion-implanted silicon wafers

Bincheng Li, Derrick Shaughnessy, Andreas Mandelis et al. · Journal of Applied Physics · 2004 · 40 citations

Engineering, Silicon On Insulator, Semiconductor Device +16