Young Dong Kim

Temperature dependence of optical properties of monolayer WS2 by spectroscopic ellipsometry

Hoàng Tùng Nguyễn, Tae Jung Kim, Han Gyeol Park et al. · Applied Surface Science · 2020 · 38 citations

Transition Metal Chalcogenides, Optical Materials, Engineering +10

Temperature dependent band-gap energy for Cu2ZnSnSe4: A spectroscopic ellipsometric study

Sukgeun Choi, T.J. Kim, Soon Yong Hwang et al. · Solar Energy Materials and Solar Cells · 2014 · 34 citations · Full text

Ii-vi Semiconductor, Transition Metal Chalcogenides, Engineering +9

Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry

Mangesh S. Diware, Kyunam Park, Jihun Mun et al. · Current Applied Physics · 2017 · 33 citations

Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling

Shih‐Hsin Hsu, E Liu, Yia‐Chung Chang et al. · physica status solidi (a) · 2008 · 31 citations

Materials Science, Surface Characterization, Nanoscale System +15

Parametric modeling of the dielectric functions of Cd1−xMgxTe alloy films

Y. S. Ihn, T.J. Kim, T. H. Ghong et al. · Thin Solid Films · 2004 · 30 citations

Materials Science, Materials Engineering, Ii-vi Semiconductor +6