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Publication | Closed Access

Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry

DOI

33

Citations

39

References

2017

Year

Mangesh S. Diware, Kyunam Park, Jihun Mun, Han Gyeol Park, Won Chegal, Yong Jai Cho, Hyun Mo Cho, Jusang Park, Hyungjun Kim, Sang‐Woo Kang,
Current Applied Physics

References

YearCitations

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