Yuzo Takamatsu

On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits

Hiroshi Takahashi, K. O. Boateng, Kewal K. Saluja et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2002 · 58 citations

Engineering, Computer Engineering, Computer Science +11

Diagnostic test generation for transition faults using a stuck-at ATPG tool

Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno et al. · 2009 · 30 citations

Engineering, Computer Engineering, Fault-tolerant Computing +12

A flexible, lightweight braille sheet display with plastic actuators driven by an organic field-effect transistor active matrix

Yasuhiro Kato, Shingo Iba, Tsuyoshi Sekitani et al. · 2006 · 22 citations

Engineering, Materials Engineering, Materials Science +14

Test Generation for Scan Design Circuits with Tri-State Modules and Bidirectional Terminals

Takuji Ogihara, Shinichi Murai, Yuzo Takamatsu et al. · Design Automation Conference · 1983 · 21 citations

Engineering, Computer Engineering, Electrical Engineering +17

A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits

Hiroshi Takahashi, K.J. Keller, Kim Le et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2005 · 19 citations

Engineering, Computer Engineering, Computer Science +16