Alexandra Neill

A model for capacitance reconstruction from measured lossy MOS capacitance voltage characteristics

K.S.K. Kwa, Sanatan Chattopadhyay, Nebojša Janković et al. · Semiconductor Science and Technology · 2002 · 104 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +12

Strained Si/SiGe n-channel MOSFETs: impact of cross-hatching on device performance

Sarah H. Olsen, Alexandra Neill, David J. Norris et al. · Semiconductor Science and Technology · 2002 · 36 citations

Electrical Engineering, Engineering, Strained Si +10

C–V characterization of strained Si/SiGe multiple heterojunction capacitors as a tool for heterojunction MOSFET channel design

Sanatan Chattopadhyay, K.S.K. Kwa, Sarah H. Olsen et al. · Semiconductor Science and Technology · 2003 · 34 citations

Electrical Engineering, Cmos Devices, Engineering +8

Direct measurement of residual stress in sub-micron interconnects

Alton B. Horsfall, Jorge M. Santos, S. Soare et al. · Semiconductor Science and Technology · 2003 · 32 citations

Engineering, Mechanical Engineering, Process-induced Stress +16

Societal perceptions and attitudes towards genetically modified (GM) crops, feed, and food products in the Middle East, North Africa, and Turkey (MENAT) region: A systematic literature review

Khalid Ramadan Medani, Alexandra Neill, Guy Garrod et al. · Food Quality and Preference · 2024 · 24 citations · Full text

Nutrition, Economics, North Africa +15