J. C. Sheffield

Secondary electron emission induced by 5–30-keV monatomic ions striking thin oxide films

L. A. Dietz, J. C. Sheffield · Journal of Applied Physics · 1975 · 89 citations

Engineering, Ion Beam Instrumentation, 5–30-Kev Monatomic Ions +17

A Three Stage Mass Spectrometer

F. A. White, F. M. Rourke, J. C. Sheffield · Applied Spectroscopy · 1958 · 46 citations

Stage Mass Spectrometer, Analytical Instrumentation, Microscopy +12

Spectrometer for Measuring Secondary Electron Yields Induced by Ion Impacts on Thin Film Oxide Surfaces

L. A. Dietz, J. C. Sheffield · Review of Scientific Instruments · 1973 · 45 citations

Engineering, Ion Beam Instrumentation, Ion Impacts +17

Charge Permutation and Dissociation of Molecular Ions by Impact with Neutral Molecules

F. M. Rourke, J. C. Sheffield, William D. Davis et al. · The Journal of Chemical Physics · 1959 · 29 citations

Engineering, Equilibrium Charge Ratios, Computational Chemistry +19

Mass Analysis of Subnanogram Quantities of Iodine.

James A. McHugh, J. C. Sheffield · Analytical Chemistry · 1965 · 27 citations

Altmetrics, Engineering, Gas Chromatography +13