L. A. Dietz

Secondary electron emission induced by 5–30-keV monatomic ions striking thin oxide films

L. A. Dietz, J. C. Sheffield · Journal of Applied Physics · 1975 · 89 citations

Engineering, Ion Beam Instrumentation, 5–30-Kev Monatomic Ions +17

Basic Properties of Electron Multiplier Ion Detection and Pulse Counting Methods in Mass Spectrometry

L. A. Dietz · Review of Scientific Instruments · 1965 · 64 citations

Engineering, Ion Beam Instrumentation, Chemistry +21

Internal Standard Technique for Precise Isotopic Abundance Measurments in Thermal Ionization Mass Spectrometry.

L. A. Dietz, C. F. Paghugki, G. A. Land · Analytical Chemistry · 1962 · 59 citations

A. Dietz, Engineering, Biological Mass Spectrometry +16

Ion Optics for the V-Type Surface Ionization Filament Used in Mass Spectrometry

L. A. Dietz · Review of Scientific Instruments · 1959 · 46 citations

Optical Materials, Engineering, Microscopy +23

Spectrometer for Measuring Secondary Electron Yields Induced by Ion Impacts on Thin Film Oxide Surfaces

L. A. Dietz, J. C. Sheffield · Review of Scientific Instruments · 1973 · 45 citations

Engineering, Ion Beam Instrumentation, Ion Impacts +17