Carlos M. Castaneda

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2009 · 163 citations

Engineering, Computer Engineering, Electrical Engineering +8

Radiation resistance of electro-optic polymer-based modulators

Edward W. Taylor, James E. Nichter, Fazio Nash et al. · Applied Physics Letters · 2005 · 43 citations

Natural Sciences, Materials Engineering, Materials Science +17

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

Jonathan A. Pellish, Paul W. Marshall, Kenneth P. Rodbell et al. · IEEE Transactions on Nuclear Science · 2014 · 37 citations · Full text

Engineering, Electrical Engineering, Physics +14

Proton production cross sections for 14C from silicon and oxygen: implications for cosmic-ray studies

J. M. Sisterson, A. J. T. Jull, A. Beverding et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1994 · 21 citations

Natural Sciences, Astronomy, Physics +10

Measuring excitation functions needed to interpret cosmogenic nuclide production in lunar rocks

J. M. Sisterson, Kyeong J Kim, A. Beverding et al. · AIP conference proceedings · 1997 · 17 citations

Natural Sciences, Earth Sciences, Physics +17