Shinichi Kamiya

Effects of Traps Formed by Threading Dislocations on Off-State Breakdown Characteristics in GaN Buffer Layer in AlGaN/GaN Heterostructure Field-Effect Transistors

Akihiro Hinoki, Junjiroh Kikawa, Tomoyuki Yamada et al. · Applied Physics Express · 2007 · 46 citations

Engineering, Electrical Engineering, Materials Science +17

1060nm VCSEL for inter-chip optical interconnection

K. Takaki, Suguru Imai, Shinichi Kamiya et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2011 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +17

Experimental demonstration of low jitter performance and high reliable 1060nm VCSEL arrays for 10Gbpsx12ch optical interconnection

K. Takaki, Norihiro Iwai, Shinichi Kamiya et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009 · 13 citations

Engineering, Electrical Engineering, Microelectronics +15

Correlation between the leakage current and the thickness of GaN‐layer of AlGaN/GaN‐HFET

Akihiro Hinoki, Shinichi Kamiya, Tadayoshi Tsuchiya et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2007 · 12 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Reliability study of 1060nm 25Gbps VCSEL in terms of high speed modulation

Toshihito Suzuki, Suguru Imai, Shinichi Kamiya et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012 · 11 citations

Engineering, Electrical Engineering, Materials Science +17