H.J. Stock

Thermal stability of Mo/Si multilayer soft-X-ray mirrors fabricated by electron-beam evaporation

H.J. Stock, U. Kleineberg, B. Heidemann et al. · Applied Physics A · 1994 · 28 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +13

Smoothing of interfaces in ultrathin Mo/Si multilayers by ion bombardment

A. Kloidt, H.J. Stock, U. Kleineberg et al. · Thin Solid Films · 1993 · 19 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +14

X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics

M. Jergel, V. Holý, E. Majková et al. · Physica B Condensed Matter · 1998 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +16

Mo0.5Si0.5/Si multilayer soft x-ray mirrors, high thermal stability, and normal incidence reflectivity

H.J. Stock, U. Kleineberg, A. Kloidt et al. · Applied Physics Letters · 1993 · 13 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Interface Stability and Silicide Formation in High Temperature Stable MoxSi1−x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and HRTEM

U. Kleineberg, H.J. Stock, A. Kloidt et al. · physica status solidi (a) · 1994 · 11 citations · Full text

Engineering, Materials Engineering, Materials Science +17