J. Conrad

Epitaxial growth of CuInS2 on sulphur terminated Si(111)

H. Metzner, Th. Hahn, Johannes Bremer et al. · Applied Physics Letters · 1996 · 55 citations

Materials Science, Semiconductors, Engineering +11

Thin CuInS2 films by three-source molecular beam deposition

M. Gossla, Th. Hahn, H. Metzner et al. · Thin Solid Films · 1995 · 46 citations

Materials Science, Engineering, Nanotechnology +7

Ion-beam-induced amorphization of 6H-SiC

W. Bolse, J. Conrad, T. Rödle et al. · Surface and Coatings Technology · 1995 · 41 citations

Materials Engineering, Ion-beam-induced Amorphization, Ion Implantation +4

Rutherford backscattering spectroscopy of rough films: Experimental aspects

H. Metzner, Th. Hahn, M. Gossla et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1998 · 37 citations

Surface Characterization, Rough Films, Engineering +7

Irradiation effects in α-SiC studied via RBS-C, Raman-scattering and surface profiling

J. Conrad, T. Rödle, Thomas Weber et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1996 · 30 citations

Materials Science, Surface Profiling, Surface Characterization +7